Title :
Optimal interconnect atpg under a ground-flounce constraint
Author :
Hollmann, Henk D L ; Marinissen, Erik Jan ; Venneulen, B.
Author_Institution :
Philips Research Laboratories
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Circuit testing; Controllability; Hamming distance; Integrated circuit interconnections; Integrated circuit testing; Laboratories; Observability; Wires;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270860
