Title :
Bist for deep submicron asic memories with high performance application
Author :
Powell, Theo J. ; Cheng, Wu-Tung ; Rayhawk, Joseph ; Samman, Omer ; Policke, Paul ; Lai, Sherry
Author_Institution :
Texas Instruments Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application specific integrated circuits; Built-in self-test; Frequency; Geometry; Instruments; Logic arrays; Random access memory; Read-write memory; Testing; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270862
