Title :
Application and analysis of rt-level software-based self-testing for embedded processor cores
Author :
Kranitis, N. ; Xenoulis, G. ; Paschalis, A. ; Gizopoulos, D. ; Zorian, Y.
Author_Institution :
University of Athens
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application software; Automatic testing; Built-in self-test; Energy consumption; Hardware; Logic; Manufacturing processes; Semiconductor device testing; Software testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270868
