DocumentCode

403829

Title

Reducing test-data volume using random-testable and periodic-testable scan chains in circuits with multiple scan chains

Author

Pomeranz, Irith

Author_Institution

School of Electrical & Computer Eng., Purdue University

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

441

Lastpage

450

Keywords

Circuit faults; Circuit testing; Clocks; Electrical fault detection; Fault detection; Test data compression;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270869

Filename

1270869