Title :
Reducing test-data volume using random-testable and periodic-testable scan chains in circuits with multiple scan chains
Author_Institution :
School of Electrical & Computer Eng., Purdue University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit testing; Clocks; Electrical fault detection; Fault detection; Test data compression;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270869
