Title :
Deterministic BIST based on a reconfigurable interconnection network
Author :
Li, Lei ; Chakrabarty, Krishnendu
Author_Institution :
Duke University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Bandwidth; Built-in self-test; Circuit testing; Hardware; Integrated circuit testing; Multiprocessor interconnection networks; System-on-a-chip; Test data compression; Test pattern generators;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270871
