• DocumentCode
    403830
  • Title

    Deterministic BIST based on a reconfigurable interconnection network

  • Author

    Li, Lei ; Chakrabarty, Krishnendu

  • Author_Institution
    Duke University
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    460
  • Lastpage
    469
  • Keywords
    Automatic testing; Bandwidth; Built-in self-test; Circuit testing; Hardware; Integrated circuit testing; Multiprocessor interconnection networks; System-on-a-chip; Test data compression; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270871
  • Filename
    1270871
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403830