Title :
Double-tree scan: a novel low-power scan-path architecture
Author :
Bhattacharya, Bhargab B. ; Seth, Sharad C. ; Zhang, Sheng
Author_Institution :
University of Nebraska-Lincoln
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Clocks; Computer architecture; Flip-flops; Logic design; Logic devices; Minimization; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270872
