• DocumentCode
    403839
  • Title

    Test vector generation based on correlation model for ratio-IDDQ

  • Author

    Sun, Xiaoyun ; Kinney, Larry ; Vinnakota, Bapiraju

  • Author_Institution
    University of Minnesota
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    545
  • Lastpage
    554
  • Keywords
    CMOS technology; Circuit testing; Equations; Fault detection; Frequency; Leakage current; Logic testing; Nearest neighbor searches; Sun; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270881
  • Filename
    1270881
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403839