Title :
High quality atpg for delay defects
Author :
Gupta, Puneet ; Hsiao, Michael S.
Author_Institution :
Virginia Tech
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Contracts; Delay effects; Electrical fault detection; Engines; Fault detection; Robustness;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270885
