DocumentCode
403843
Title
High quality atpg for delay defects
Author
Gupta, Puneet ; Hsiao, Michael S.
Author_Institution
Virginia Tech
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
584
Lastpage
591
Keywords
Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Contracts; Delay effects; Electrical fault detection; Engines; Fault detection; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270885
Filename
1270885
Link To Document