مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

403848

Title :

First ic validation of IEEE Std. 1149.6

Author :

Vandivier, Suzette ; Wahl, Mark ; Rearick, Jeff

Author_Institution :

Agilent Technologies

Volume :

fYear :

2003

fDate :

Sept. 30-Oct. 2, 2003

Firstpage :

632

Lastpage :

639

Keywords :

Circuit faults; Circuit testing; Integrated circuit testing; Logic testing; Noise robustness; Paper technology; Pins; Signal design; Timing; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN :

1089-3539

Print_ISBN :

0-7803-8106-8

Type :

conf

DOI :

10.1109/TEST.2003.1270890

Filename :

1270890

Link To Document :