DocumentCode

403848

Title

First ic validation of IEEE Std. 1149.6

Author

Vandivier, Suzette ; Wahl, Mark ; Rearick, Jeff

Author_Institution

Agilent Technologies

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

632

Lastpage

639

Keywords

Circuit faults; Circuit testing; Integrated circuit testing; Logic testing; Noise robustness; Paper technology; Pins; Signal design; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270890

Filename

1270890