DocumentCode

403850

Title

Adapting jtag for ac interconnect testing

Author

Whetsel, Lee

Author_Institution

Texas Instruments

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

641

Lastpage

650

Keywords

Capacitors; Circuit testing; Instruments; Integrated circuit interconnections; Logic testing; Registers; Resistors; Standards development; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270892

Filename

1270892