DocumentCode

403851

Title

Vdd ramp testing for rf circuits

Author

De Gyvez, José Pineda ; Gronthoud, Guido ; Amine, Rashid

Author_Institution

Philips Research Laboratories

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

651

Lastpage

658

Keywords

Automatic test pattern generation; Circuit faults; Circuit testing; Costs; Fault detection; Packaging; Power supplies; Radio frequency; Shape; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270893

Filename

1270893