Title :
Vdd ramp testing for rf circuits
Author :
De Gyvez, José Pineda ; Gronthoud, Guido ; Amine, Rashid
Author_Institution :
Philips Research Laboratories
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Circuit faults; Circuit testing; Costs; Fault detection; Packaging; Power supplies; Radio frequency; Shape; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270893
