• DocumentCode
    403858
  • Title

    Chardin: an off-chip transient current monitor with digital interface for production testing

  • Author

    Alorda, B. ; Bloechel, B. ; Keshavarzi, A. ; Segura, J.

  • Author_Institution
    Microprocessor Research Labs, Intel Corporation
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    719
  • Lastpage
    726
  • Keywords
    Charge measurement; Circuit testing; Current measurement; Current supplies; Monitoring; Noise measurement; Production; Shape measurement; Transient analysis; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270901
  • Filename
    1270901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403858