Title :
On reducing aliasing effects and improving diagnosis of logic bist failures
Author :
Tekumalla, Ramesh C.
Author_Institution :
Sun Microsystems, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Logic; Shift registers; Sun; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270903
