Title :
Convolutional compaction of test responses
Author :
Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen ; Reddy, Sudhakar M.
Author_Institution :
Poznan University of Technology
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Compaction; Electronics industry; Graphics; Integrated circuit testing; Moore´s Law; Semiconductor device testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270904
