DocumentCode
403861
Title
Latch divergency in microprocessor failure analysis
Author
Dahlgren, Peter ; Dickinson, Paul ; Parulkar, Ishwar
Author_Institution
Sun Microsystems, Inc.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
755
Lastpage
763
Keywords
Automatic test pattern generation; Built-in self-test; Failure analysis; Intelligent networks; Linear discriminant analysis; Logic testing; Manufacturing; Microprocessors; Noise reduction; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270905
Filename
1270905
Link To Document