Title :
IBISTTM (interconnect built-in self-test) architecture and methodology for pci express: intel´s next-generation test and validation methodology for performance IO
Author_Institution :
Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; System testing; USA Councils;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270909
