Title :
Outlier detection for dppm reduction
Author :
Buxton, Paul ; Tabor, Paul
Author_Institution :
Test Advantage Ltd.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; Fault diagnosis; Life testing; Manufacturing processes; Printed circuits; Semiconductor device manufacture;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270914
