Title :
Analyzing the effectiveness of multiple-detect test sets
Author :
Blanton, R.D. ; Dwarakanath, Kumar N. ; Shah, Anirudh B.
Author_Institution :
Carnegie Mellon University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Signal analysis; Silicon; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271073
