• DocumentCode
    403887
  • Title

    Analyzing the effectiveness of multiple-detect test sets

  • Author

    Blanton, R.D. ; Dwarakanath, Kumar N. ; Shah, Anirudh B.

  • Author_Institution
    Carnegie Mellon University
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    876
  • Lastpage
    885
  • Keywords
    Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Signal analysis; Silicon; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271073
  • Filename
    1271073
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403887