Title :
Optimization of test/diagnosis/rework location(s) and characteristics in electronic systems assembly using real-coded genetic algorithms
Author :
Shi, Zhen ; Sandborn, Phillip
Author_Institution :
University of Maryland
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Assembly systems; Cost function; Electronic equipment testing; Fault diagnosis; Genetic algorithms; Manufacturing processes; Optimization methods; Performance evaluation; System testing; Virtual manufacturing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271080
