Title :
Simultaneous bidirectional test data flow for a low-cost wafer test strategy
Author :
West, Burnell G.
Author_Institution :
NPTest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Built-in self-test; Circuit testing; Clocks; Costs; Coupling circuits; Data communication; Electronic equipment testing; Investments; Probes;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271081
