DocumentCode
403894
Title
Instruction based bist for board/system level test of external memories and internconnects
Author
Caty, Olivier ; Bayraktaroglu, Ismet ; Majumdar, Amitava ; Lee, Richard ; Bell, John ; Curhan, Lisa
Author_Institution
Microsoft Corporation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
961
Lastpage
970
Keywords
Access protocols; Built-in self-test; Costs; Engines; Logic testing; Manufacturing processes; Operating systems; Pipeline processing; Sun; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271083
Filename
1271083
Link To Document