Title : 
Evolution of IEEE1149.1 addressable shadow protocol devices
         
        
            Author : 
Joshi, Rakesh N. ; Williams, Kenneth L. ; Whetsel, Lee
         
        
            Author_Institution : 
Texas Instruments, Inc.
         
        
        
        
            fDate : 
Sept. 30-Oct. 2, 2003
         
        
        
        
            Keywords : 
Application specific processors; Backplanes; Circuit testing; Emulation; Instruments; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Protocols; Synchronization;
         
        
        
        
            Conference_Titel : 
Test Conference, 2003. Proceedings. ITC 2003. International
         
        
        
            Print_ISBN : 
0-7803-8106-8
         
        
        
            DOI : 
10.1109/TEST.2003.1271085