DocumentCode

403899

Title

Elimination of traditional functional testing of interface timings at intel

Author

Tripp, Mike ; Mak, T.M. ; Meixner, A.

Author_Institution

Intel Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1014

Lastpage

1022

Keywords

Automatic test equipment; Automatic testing; Circuit testing; Clocks; Costs; Degradation; Design for testability; Jitter; Temperature; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271089

Filename

1271089