DocumentCode
403901
Title
Impact of multiple-detect test patterns on product quality
Author
Benware, Brady ; Schuermyer, Chris ; Tamarapalli, Nagesh ; Tsai, Kun-Han ; Ranganathan, Sreenevasan ; Madge, Robert ; Rajski, Janusz ; Krishnamurthy, Prabhu
Author_Institution
LSI Logic Corporation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1031
Lastpage
1040
Keywords
Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Large scale integration; Logic testing; Production; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271091
Filename
1271091
Link To Document