Title :
Analog circuit test using transfer function coefficient estimates
Author :
Guo, Zhen ; Savir, Jacob
Author_Institution :
New Jersey Institute of Technology
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Jacobian matrices; Predictive models; Size measurement; Transfer functions;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271104
