• DocumentCode
    403911
  • Title

    Analog circuit test using transfer function coefficient estimates

  • Author

    Guo, Zhen ; Savir, Jacob

  • Author_Institution
    New Jersey Institute of Technology
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1155
  • Lastpage
    1163
  • Keywords
    Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Jacobian matrices; Predictive models; Size measurement; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271104
  • Filename
    1271104
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403911