DocumentCode
403914
Title
Towards structural testing of superconductor electronics
Author
Joseph, Arun A. ; Kerkhoff, Hans G.
Author_Institution
University of Twente
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1182
Lastpage
1191
Keywords
Automatic test pattern generation; Circuit faults; Circuit testing; Cooling; Electronic equipment testing; Electronics industry; High-speed networks; Logic circuits; Switches; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271107
Filename
1271107
Link To Document