DocumentCode
403916
Title
Defect tolerance at the end of the roadmap
Author
Mishra, Mahim ; Goldstein, Seth C.
Author_Institution
Carnegie Mellon University
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1201
Lastpage
1210
Keywords
Chemical technology; Circuit testing; Fabrics; Field programmable gate arrays; Integrated circuit interconnections; Lithography; Logic devices; Manufacturing; Reconfigurable logic; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271109
Filename
1271109
Link To Document