• DocumentCode
    403921
  • Title

    Application of built in self-test for interconnect testing of FPGAs

  • Author

    Fernandes, Dereck A. ; Harris, Ian G.

  • Author_Institution
    University of Massachusetts
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1248
  • Lastpage
    1257
  • Keywords
    Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic devices; Logic testing; Switches; System testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271114
  • Filename
    1271114