DocumentCode
403921
Title
Application of built in self-test for interconnect testing of FPGAs
Author
Fernandes, Dereck A. ; Harris, Ian G.
Author_Institution
University of Massachusetts
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1248
Lastpage
1257
Keywords
Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic devices; Logic testing; Switches; System testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271114
Filename
1271114
Link To Document