403922

Bist for minx 4000 and spartan series fpgas: a case study

Stroud, Charles E. ; Leach, Keshia N. ; Slaughter, Thomas A.

Auburn University

1

2003

Sept. 30-Oct. 2, 2003

1258

1267

Built-in self-test; Circuit testing; Computer aided software engineering; Field programmable gate arrays; Integrated circuit interconnections; Logic testing; Programmable logic arrays; Programmable logic devices; Routing; System testing;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271115

1271115