DocumentCode

403923

Title

Defect coverage of boundary-scan tests: what does it mean when a boundary-scan testpasses?

Author

Parker, Kenneth P.

Author_Institution

Agilent Technologies

Volume

1

fYear

2003

fDate

Sept. 30 2003-Oct. 2 2003

Firstpage

1268

Lastpage

1276

Keywords

Bills of materials; Connectors; Inductors; Integrated circuit testing; Mechanical factors; Pins; Polarization; Resistors; Soldering; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

Conference_Location

Charlotte, NC, USA

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271116

Filename

1271116