DocumentCode

403925

Title

IEEE P1581: To live or let die?

Author

De Jong, Frans ; van de Logt, L.

Author_Institution

Philips Research Eindhoven

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1278

Lastpage

1278

Keywords

Circuit testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271118

Filename

1271118