DocumentCode

403926

Title

Should nanometer circuits be periodically tested in the field?

Author

Singh, Adit D.

Author_Institution

Electrical & Computer Engineering Auburn University

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1280

Lastpage

1280

Keywords

Automatic testing; Circuit testing; Costs; Degradation; Design engineering; Frequency; Hardware; Manufacturing; System testing; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271120

Filename

1271120