• DocumentCode
    403937
  • Title

    The confluence of manufacturing test and design validation

  • Author

    Cheng, Kwang-Ting

  • Author_Institution
    University of California
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1293
  • Lastpage
    1293
  • Keywords
    Automatic test pattern generation; Circuit testing; Computer aided manufacturing; Delay; Design automation; Engines; Nanoscale devices; Semiconductor device manufacture; Semiconductor device testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271133
  • Filename
    1271133
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403937