Title :
Open architecture ate and 250 consecutive uls
Author :
Yamaguchi, Takahiro J.
Author_Institution :
Advantest Laboratories, Ltd.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bit error rate; Clocks; Integrated circuit testing; Oscilloscopes; Performance evaluation; Physical layer; Production; Sampling methods; Time measurement; Timing jitter;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271147
