Title :
Cost containment for high-volume test of multi-gb/s ports
Author :
Johnson, John C.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Cost function; Drives; Feedback; Logic testing; Manufacturing; Process design; Production facilities; Scheduling; Throughput;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271148
