DocumentCode

403954

Title

Managing the multi-gbit/s test challenges

Author

Schoettmer, Ulrich ; Laquai, Bemd

Author_Institution

Agilent Technologies

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1310

Lastpage

1310

Keywords

CMOS technology; Circuit testing; Computer networks; Costs; Instruments; Jitter; Logic testing; Moore´s Law; Network servers; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271150

Filename

1271150