Title :
Managing the multi-gbit/s test challenges
Author :
Schoettmer, Ulrich ; Laquai, Bemd
Author_Institution :
Agilent Technologies
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
CMOS technology; Circuit testing; Computer networks; Costs; Instruments; Jitter; Logic testing; Moore´s Law; Network servers; Wire;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271150
