Title :
Dfm - a fabless perspective
Author :
Khare, Jitendra B.
Author_Institution :
Ample Communications, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Buildings; Costs; Design engineering; Design for manufacture; Integrated circuit modeling; Manufacturing processes; Process design; Random access memory; Redundancy; Testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271157
