DocumentCode :
403966
Title :
Architecting millisecond test solutions for wireless phone RIFIC´s
Author :
Ferrario, John ; Wolf, Randy ; Moss, Steve
Author_Institution :
IBM RF & Analog Test Development
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1325
Lastpage :
1332
Keywords :
Circuit testing; Costs; Frequency measurement; Integrated circuit testing; Manufacturing; Noise measurement; Power measurement; Radio frequency; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271165
Filename :
1271165
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403966
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