Title :
Robust Receding Horizon Control - analysis & synthesis
Author :
Grieder, Pascal ; Parrilo, Pablo A. ; Morari, Manfred
Author_Institution :
Autom. Control Lab., ETH Zentrum, Zurich, Switzerland
Abstract :
In this paper, a combined Receding Horizon Control (RHC) analysis and synthesis technique for constrained linear time-invariant systems subject to polytopic or additive uncertainty is introduced. The proposed method consists of two components. First, the maximum robust control invariant set C∞ is computed along with the associated piecewise affine (PWA) state feedback law. This computation is based on an iterative solution of multi-parametric Quadratic Programs (mp-QP). Second, the obtained PWA feedback law is analyzed for robust stability. This analysis is based on linear matrix inequalities (LMI). The combination of these two components guarantees robust stability and constraint satisfaction for all time. Extensive numerical examples show a decrease in controller complexity by a factor of up to 250 versus established controller design methods at the cost of a degradation in performance of less than 0.5% on average.
Keywords :
T invariance; constraint theory; control system analysis; control system synthesis; infinite horizon; linear matrix inequalities; linear systems; quadratic programming; robust control; state feedback; time-varying systems; LMI; additive uncertainty; constraint satisfaction; control system analysis; control system synthesis; controller complexity; controller design; iterative solution; linear matrix inequalities; linear time invariant systems; maximum robust control invariant set; multiparametric quadratic programs; piecewise affine state feedback law; polytopic uncertainty; robust receding horizon control analysis; robust receding horizon control synthesis; robust stability; Control system analysis; Control system synthesis; Costs; Degradation; Design methodology; Linear matrix inequalities; Robust control; Robust stability; State feedback; Uncertainty;
Conference_Titel :
Decision and Control, 2003. Proceedings. 42nd IEEE Conference on
Print_ISBN :
0-7803-7924-1
DOI :
10.1109/CDC.2003.1272688