• DocumentCode
    40447
  • Title

    TFET Inverters With n-/p-Devices on the Same Technology Platform for Low-Voltage/Low-Power Applications

  • Author

    Baravelli, E. ; Gnani, Elena ; Gnudi, A. ; Reggiani, S. ; Baccarani, G.

  • Author_Institution
    Dept. of Electron., Univ. of Bologna, Bologna, Italy
  • Volume
    61
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    473
  • Lastpage
    478
  • Abstract
    This paper investigates feasible inverter configurations based on co-optimized n- and p-type tunnel field-effect transistors (TFETs) integrated on the same InAs/Al0.05Ga0.95 Sb platform. Based on 3-D full-quantum simulations, the considered devices feature steep subthreshold slopes and relatively high on- currents and are combined into two inverter designs. Benchmarking against aggressively scaled CMOS logic based on multigate architectures highlights potential of the proposed TFET implementations to perform up to 10× and 100× faster in low operating power and low standby power environments, respectively. The comparison is conducted at low supply voltages (VDD=0.25 V) and for equal levels of static power consumption. The proposed TFET-based platform is thus expected to be a good candidate for low-voltage/low-power applications in near-future technology generations.
  • Keywords
    III-V semiconductors; MOS logic circuits; aluminium compounds; indium compounds; logic gates; low-power electronics; tunnel transistors; 3D full quantum simulation; InAs-Al0.05Ga0.95Sb; TFET inverter; low power application; low voltage application; multigate architecture; n-type tunnel field effect transistor; p-type tunnel field effect transistor; steep subthreshold slope; voltage 0.25 V; CMOS integrated circuits; CMOS technology; Capacitance; Inverters; Loading; Performance evaluation; Semiconductor device modeling; III–V materials; heterojunction; subthreshold slope; tunnel-field-effect transistor (TFET);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2294792
  • Filename
    6693735