• DocumentCode
    404737
  • Title

    A wavelet based image denoising using statistical sampler for Bayesian estimator

  • Author

    Kumar, B. Anil ; Srinivasan, Meena ; Annadurai, S.

  • Author_Institution
    Electron. & Commun. Eng., Govt. Coll. of Technol., Coimbatore, India
  • Volume
    1
  • fYear
    2003
  • fDate
    15-17 Oct. 2003
  • Firstpage
    21
  • Abstract
    This paper presents a new wavelet based image denoising method, which includes a Bayesian framework and classical thresholding methods. The main goal here is computing for each wavelet coefficient the probability of being sufficiently clean. The three main novelties of our approach are: (1) estimating local regularity of an image and distinguishing between useful edges and noise; (2) initializing the mask by thresholding the average cone ratio (ACR); and (3) probabilistic shrinkage of wavelet coefficients, using a statistical sampler. The main advantage of this algorithm is improved denoising performance over earlier techniques, which is demonstrated in the results.
  • Keywords
    Bayes methods; edge detection; image denoising; image sampling; parameter estimation; probability; wavelet transforms; Bayesian estimator; average cone ratio; clean probability; image local regularity; mask initialization; performance; probabilistic shrinkage; statistical sampler; thresholding; thresholding methods; useful edges; wavelet based image denoising; wavelet coefficient; Bayesian methods; Computational complexity; Educational institutions; Image denoising; Image edge detection; Image reconstruction; Noise reduction; Pixel; Wavelet coefficients; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2003. Conference on Convergent Technologies for the Asia-Pacific Region
  • Print_ISBN
    0-7803-8162-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2003.1273205
  • Filename
    1273205