Title :
Hard X-ray holography and numerical simulation
Author :
Chen, Jianwen ; Gao, Hongyi ; Xie, Honglan ; Xiong, Shisheng ; Xu, Zhizhan
Author_Institution :
Shanghai Inst. of Opt. & Fine Mech., Chinese Acad. of Sci., China
Abstract :
Two kinds of hard X-ray holography with atomic resolution including inside source holography and inside detector holography are presented, and the numerical simulation of X-ray fluorescence hologram and the reconstructed real space images are given.
Keywords :
X-ray fluorescence analysis; holography; image reconstruction; numerical analysis; optical images; optical information processing; X-ray fluorescence hologram numerical simulation; atomic resolution; hard X-ray holography; inside detector holography; inside source holography; real space images reconstruction; Atom optics; Atomic measurements; Fluorescence; Holographic optical components; Holography; Image reconstruction; Iron; Numerical simulation; Optical scattering; X-ray imaging;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1274588
