Title :
Optical constants determination of an anisotropic thin film by attenuated total reflection method analyzed by sensitivity calculation
Author :
Jen, Yi-Jun ; Peng, Cheng-Yu
Author_Institution :
Dept. of Photonics, Nat. Taipei Univ. of Technol., Taiwan
Abstract :
In order to measure the anisotropic optical constants of thin films accurately, the sensitivity of attenuated total reflection curve is analyzed. According to the analysis, two curve fitting procedures are developed to determine two principal indices of refraction and principal axes orientation.
Keywords :
attenuated total reflection; optical films; optical materials; refractive index; thin films; anisotropic optical constants; anisotropic thin film; attenuated total reflection curve; attenuated total reflection method; curve fitting procedures; optical constants determination; principal axes orientation; principal indices of refraction; sensitivity calculation; Anisotropic magnetoresistance; Attenuation measurement; Curve fitting; Geometrical optics; Optical attenuators; Optical films; Optical reflection; Optical refraction; Optical sensors; Photonics;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1277153
