DocumentCode :
405758
Title :
Co-optimization for test data compression and testing power based on variable-tail code
Author :
Yinhe Han ; Yongjun Xu ; Xiaowei Li
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
Volume :
1
fYear :
2003
fDate :
21-24 Oct. 2003
Firstpage :
105
Abstract :
We present a novel code: Variable-Tail code to compress the test data, which is proved to be better than the Golomb code. An efficient reordering algorithm(ERA) is proposed to optimize the distribution of run-lengths in the test data in order to improve the compression effectiveness. On other hand, since the power during testing is always higher than the normal functional mode, the power dissipated in the CUT must be reduced during testing which is omitted previously. The analysis and experiments have demonstrated that our ERA can significantly reduce the total testing power and average power dissipated in the CUT with no hardware are penalty.
Keywords :
circuit optimisation; circuit testing; data compression; CUT; ERA; Golomb code; VTC; average power dissipation; circuit under test; co-optimization; efficient reordering algorithm; normal functional mode; power testing; run length distribution; test data compression; variable tail code;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
ISSN :
1523-553X
Print_ISBN :
0-7803-7889-X
Type :
conf
DOI :
10.1109/ICASIC.2003.1277501
Filename :
1277501
Link To Document :
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