Title :
A algorithm of yield analysis based on kernel density estimate
Author :
Zhou Lei ; Sun Lingling ; Liu Jun
Author_Institution :
Microelectron. CAD Center, Hangzhou Inst. of Electron. Eng., China
Abstract :
In this paper, a new yield analysis algorithm based on kernel density estimate is developed. With the new algorithm, we can obtain the result by dozens simulations on data of arbitrary model. It is more accurate and efficient than other traditional yield analysis method such as Monte Carlo approach. The test example shows that this algorithm has much practical value in yield analysis of IC design.
Keywords :
Monte Carlo methods; integrated circuit yield; probability; IC design; Monte Carlo method; integrated circuit design; kernel density estimate; yield analysis algorithm;
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
Print_ISBN :
0-7803-7889-X
DOI :
10.1109/ICASIC.2003.1277535
