DocumentCode :
408488
Title :
Congestion driven placement for VLSI standard cell design
Author :
Areibi, Shawki ; Yang, Zhen
Author_Institution :
Sch. of Eng., Guelph Univ., Ont., Canada
fYear :
2003
fDate :
9-11 Dec. 2003
Firstpage :
304
Lastpage :
307
Abstract :
The sub-micron regime has caused the interconnect delay to become a critical determiner of circuit performance. As a result, circuit placement is starting to play an important role in today´s high performance chip designs. In addition to wirelength optimization, the issue of reducing excessive congestion in local regions such that the router can finish the routing successfully is becoming another important problem. In this paper, a post-processing congestion reduction technique is implemented and incorporated into the flat and hierarchical placement. Results obtained show that the congestion-driven placement approach reduces the congestion by about 51% for flat designs and 37% for hierarchical designs with a slight increase in wirelength.
Keywords :
VLSI; circuit layout CAD; integrated circuit layout; integrated circuit modelling; VLSI standard cell design; chip design; circuit performance; congestion driven placement; congestion reduction technique; hierarchical placement; interconnect delay; wirelength optimization; Algorithm design and analysis; Chip scale packaging; Circuit optimization; Delay; Design automation; Integrated circuit interconnections; Phase estimation; Routing; Very large scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2003. ICM 2003. Proceedings of the 15th International Conference on
Print_ISBN :
977-05-2010-1
Type :
conf
DOI :
10.1109/ICM.2003.1287818
Filename :
1287818
Link To Document :
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