DocumentCode :
408660
Title :
A method for tuning dielectric loaded accelerating structures
Author :
Kanareykin, A. ; Gai, W. ; Power, J.G. ; Nenasheva, E. ; Karmanenko, S. ; Sheinman, I.
Author_Institution :
LLC, Euclid Concepts, Solon, OH, USA
Volume :
3
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
1888
Abstract :
We present a method to vary the resonant frequency of a dielectric loaded accelerating (DLA) structure driven by either the wakefield of a beam or an external rf source. The structure consists of a thick ceramic layer backed by a thin layer of ferroelectric. The overall frequency of the DLA structure is tuned by applying a DC bias voltage to the ferroelectric layer in order to vary its permittivity. This scheme is needed to compensate for frequency shifts in DLA structures due to machining imperfections and dielectric constant heterogeneity. We have identified BST ferroelectric-oxides compounds as a suitable material for this application; it has a relative dielectric constant that can be tuned from 300 to 500. From this, we calculate that the overall frequency of the structure can be tuned over a range of (2÷4)% for an X-band DLA structure. In this paper, a detailed model of the DLA structure is given and an experimental test is proposed. We present cold test measurements for an 11.424 GHz planar tunable DLA structure.
Keywords :
accelerator RF systems; beam handling techniques; dielectric-loaded waveguides; electron accelerators; ferroelectric thin films; particle beam diagnostics; permittivity; 11.424 GHz; BaSrTiO3; DC bias voltage; DLA structures; X-band DLA structure; beam wakefield; ceramic layer; cold test measurements; dielectric constant heterogeneity; dielectric loaded accelerating structures; external radiofrequency source; frequency shifts; identified BST ferroelectric-oxides compounds; machining imperfections; permittivity; planar tunable DLA structure; resonant frequency; thin ferroelectric layer; tuning; Acceleration; Ceramics; Dielectric constant; Ferroelectric materials; Particle beams; Permittivity; Resonant frequency; Testing; Tuning; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
ISSN :
1063-3928
Print_ISBN :
0-7803-7738-9
Type :
conf
DOI :
10.1109/PAC.2003.1288709
Filename :
1288709
Link To Document :
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