Title :
RHIC pressure rise and electron cloud
Author :
Zhang, S.Y. ; Bai, M. ; Blaskiewicz, M. ; Cameron, P. ; Drees, A. ; Fischer, W. ; Gassner, D. ; Gullotta, J. ; He, P. ; Hseuh, H.C. ; Huang, H. ; Iriso-Ariz, U. ; Lee, R. ; Mackay, W.W. ; Oerter, B. ; Ptitsyn, V. ; Ponnaiyan, V. ; Roser, T. ; Satogata, T.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Abstract :
In RHIC high intensity operation, two types of pressure rise are currently of concern. The first type is at the beam injection, which seems to be caused by the electron multipacting, and the second is the one at the beam transition, where the electron cloud is not the dominant cause. The first type of pressure rise is limiting the beam intensity and the second type might affect the experiments background for very high total beam intensity. In this article, the pressure rises at RHIC are described, and preliminary study results are reported. Some of the unsettled issues and questions are raised, and possible counter measures are discussed.
Keywords :
ion accelerators; particle beam bunching; particle beam diagnostics; synchrotrons; RHIC pressure rise; beam injection; beam transition; electron cloud; electron multipacting; Clouds; Coatings; Counting circuits; Electron beams; Energy measurement; Gold; Helium; Ion beams; Pressure measurement; Solenoids;
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Print_ISBN :
0-7803-7738-9
DOI :
10.1109/PAC.2003.1288839
