Title :
Self-consistent, unbiased exclusion methods of emittance analysis
Author :
Stockli, Martin P. ; Welton, R.F. ; Keller, R.
Author_Institution :
SNS, Oak Ridge Nat. Lab., TN, USA
Abstract :
We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainty. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.
Keywords :
SCF calculations; particle beam diagnostics; SCUBEEx; bias; ellipse size; emittance analysis; orientation; rms emittance; self-consistent method; self-consistent unbiased exclusion methods; shape; Background noise; Coordinate measuring machines; Laboratories; OWL; Particle beam measurements; Particle beams; Particle measurements; Position measurement; Shape; Yield estimation;
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Print_ISBN :
0-7803-7738-9
DOI :
10.1109/PAC.2003.1288967