Emittance measurements with a pulsed power photoinjector

Author

Smedley, J. ; Srinivasan-Rao, T. ; Tsang, T. ; Farrell, J.P. ; Batchelor, K.

Author_Institution

Brookhaven Nat. Lab., Upton, NY, USA

Volume

1

fYear

2003

fDate

12-16 May 2003

Firstpage

541

Abstract

This paper describes measurements of beam spot size and emittance of electron beams from a pulsed power photo-injector operating at 150keV output energy. In these measurements, electron bunches with charge up to 20 pC were created by a 300 fs pulse duration Ti:sapphire laser system illuminating a polished copper cathode. Images of the electron beam were captured at two locations downstream from a solenoid focusing magnet. The focal spot size was studied as a function of bunch charge and accelerating gradient. Beam waists down to 85 microns were obtained. The focal spot size was found to be dominated by spherical aberration at low beam charges, however the beam trajectory is in good agreement with simulation.

Keywords

aberrations; electron accelerators; electron beams; electron sources; emissivity; particle beam diagnostics; particle beam injection; 150 keV; 300 fs; 85 micron; beam charges; beam spot size; beam trajectory; electron bunches; emittance measurements; focal spot size; pulsed power photoinjector; sapphire laser system; solenoid focusing magnet; spherical aberration; Charge measurement; Copper; Current measurement; Electron beams; Energy measurement; Laser beams; Optical pulses; Power measurement; Pulse measurements; Size measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the

ISSN

1063-3928

Print_ISBN

0-7803-7738-9

Type

conf

DOI

10.1109/PAC.2003.1288971

Filename

1288971